• Chinese Optics Letters
  • Vol. 13, Issue 6, 060602 (2015)
Shuang Liu1、2, Shupei Zheng1、2, Ke Yang1、2, and Danping Chen1、*
Author Affiliations
  • 1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.3788/COL201513.060602 Cite this Article Set citation alerts
    Shuang Liu, Shupei Zheng, Ke Yang, Danping Chen. Radiation-induced change of OH content in Yb-doped silica glass[J]. Chinese Optics Letters, 2015, 13(6): 060602 Copy Citation Text show less

    Abstract

    Yb-doped silica glasses containing low, medium, and high content of OH are prepared through nanoporous glass sintering technology. High-OH sample exhibits better X-ray irradiation resistivity than low- and medium-OH samples. After irradiation, OH content of low- and medium-OH samples increases 37.5% and 11%, respectively; in contrast, OH content of high-OH sample decreases dramatically. The different OH content changes among the samples are discussed regarding the proposed inter-conversion reactions involving Si-H and Si-OH during the irradiation.
    Si+Si-OHSi-O+Si-H.(1)

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    Si-O+Si-HSi+Si-OH.(2)

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    SiO-Si+hνSi+O-Si(3)

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    Shuang Liu, Shupei Zheng, Ke Yang, Danping Chen. Radiation-induced change of OH content in Yb-doped silica glass[J]. Chinese Optics Letters, 2015, 13(6): 060602
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