Bin MA, Zhiqiang HOU, Hongfei JIAO, Jinlong ZHANG, Zhengxiang SHEN, Xinbin CHENG, Zhanshan WANG. Pulsed laser-induced damage threshold measurement and damage performance of optical components[J]. Optics and Precision Engineering, 2022, 30(21): 2805
- Optics and Precision Engineering
- Vol. 30, Issue 21, 2805 (2022)
Fig. 1. Dual 1 064 nm laser dual delay detection optical path
Fig. 2. Nanosecond laser damage threshold measurement system appearance
Fig. 3. Software control and limitation defect identification interface
Fig. 4. Recognition repeatability of defects of different sizes in continuous scanning images during raster scan measurement
Fig. 5. Laser damage transient measurement based on pump-probe technology
Fig. 6. LIDT of 1 064 nm highly reflective thin films
Fig. 7. Raster scan measurement of high reflective films at 1 064nm
Fig. 8. Transient diagnosis of laser damage source of transmission element
Fig. 9. In-situ measurement and reset accuracy
Fig. 10. Comparison of plasma eruption characteristics in vacuum and atmosphere
Fig. 11. Damage morphology and damage threshold of nodular tumor under femtosecond laser irradiation
Fig. 12. Damage morphology and damage threshold of nodular tumor under nanosecond laser irradiation
Fig. 13. Initial damage morphology and damage growth pattern of dozens of microns
Fig. 14. Shell initial damage morphology and size information
Fig. 15. Initial damage morphology and damage growth rule of micro-nano size
Fig. 16. Damage morphologies of highly reflective films at different wavelengths
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Table 1. Several damage threshold data［99］
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