• Journal of Applied Optics
  • Vol. 44, Issue 3, 655 (2023)
Yuxin YANG, Xuexin WANG*, Xu ZHANG, Bing YU..., Siwei LI, Yi XIE and Xiaoyu YAN|Show fewer author(s)
Author Affiliations
  • The First Scale Optical Metrology Station of the Science, Technology and Industry for National Defense, Xi'an Institute of Applied Optics, Xi'an 710065, China
  • show less
    DOI: 10.5768/JAO202344.0304004 Cite this Article
    Yuxin YANG, Xuexin WANG, Xu ZHANG, Bing YU, Siwei LI, Yi XIE, Xiaoyu YAN. Emissivity calibration technology for infrared stealth coatings at ambient temperature[J]. Journal of Applied Optics, 2023, 44(3): 655 Copy Citation Text show less

    Abstract

    As the key index of stealth performance of aircraft skin, the emissivity is an important means to evaluate the comprehensive stealth performance of the aircraft. The spectral emissivity measurement method of infrared stealth coatings was introduced, and the corresponding calibration device at ambient temperature was established. A Fourier transform spectrometer based on Michelson interference theory was designed to realized the spectral splitting. The sample chamber with gold-plated integrating sphere was used to realize the vertical incidence and diffuse receiving of the signal, and the accurate measurement for spectral emissivity of stealthy coating was realized. A traceability method using diffuse reflection films as the reference standard was proposed, which realized the traceability of calibration device. Finally, the spectral emissivity of brass and other samples was measured by using the proposed calibration device, and the measurement results with a spectral range of 3 μm~12 μm were obtained. The measurement uncertainty of spectral emissivity is better than 3.2% (k=2).
    Yuxin YANG, Xuexin WANG, Xu ZHANG, Bing YU, Siwei LI, Yi XIE, Xiaoyu YAN. Emissivity calibration technology for infrared stealth coatings at ambient temperature[J]. Journal of Applied Optics, 2023, 44(3): 655
    Download Citation