• Chinese Journal of Lasers
  • Vol. 35, Issue 6, 916 (2008)
Pan Yongqiang1、2、*, Wu Zhensen2, and Hang Lingxia1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    Pan Yongqiang, Wu Zhensen, Hang Lingxia. Optical Thin Films Interfaces Roughness Cross-Correlated Properties and Light Scattering[J]. Chinese Journal of Lasers, 2008, 35(6): 916 Copy Citation Text show less
    References

    [1] R. Haelbich, A. Segmiiller. Smooth multilayer films suitable for X-ray mirrors[J]. Appl. Phys. Lett., 1979, 34(3):184~186

    [4] Claude Amra, C. Grèzes-Besset, L. Bruel. Comparison of surface and bulk scattering in optical multilayers[J]. Appl. Opt., 1993, 32(28):5492~5503

    [8] C. Amra, G. Albrand, P. Roche. Theory and application of antiscattering single layers:antiscattering antireflection coatings[J]. Appl. Opt., 1986, 25(16):2695~2702

    [9] P. Roche, P. Bousquet, F. Flory et al.. Determination of interface roughness cross-correlated properties of an optical coating from measurements of the angular scattering[J]. J. Opt. Soc. Am. A, 1984, 1(10):1208~1230

    [11] J. M. Elson. Theory of light scattering from a rough surfaces with an inhomogeneous dielectric permittivity[J]. Phys. Rev. B, 1984, 30(10):5460~5480

    [12] P. Bousquet, F. Flory, P. Roche. Scattering from multilayer thin films: theory and experiment[J]. J. Opt. Soc. Am., 1981, 71(9):1115~1123

    [13] C. Amra. Light scattering from multilayer optics. Ⅰ. Tools of investigation[J]. J. Opt. Soc. Am. A, 1994, 11(1):197~210

    CLP Journals

    [1] Xu Xiaomei, Hu Hong. Surface Roughness Measurement Based on Laser Speckle and Neural Network[J]. Chinese Journal of Lasers, 2009, 36(s2): 231

    [2] Gong Lei, Wu Zhensen. Different Films Influence on Polarized Light Scattering of Slightly Rough Substrate[J]. Acta Optica Sinica, 2011, 31(10): 1029001

    [3] Gong Lei, Wu Zhensen. Analysis of Light Scattering about Slightly Non-Spherical Nanoparticles on Wafers[J]. Chinese Journal of Lasers, 2011, 38(1): 110001

    [4] Pan Yongqiang, Hang Lingxia, Wu Zhensen, Wang Haohao. Influence of Ion Beam Post-Treatment on Surface Roughness of TiO2 Thin Films[J]. Chinese Journal of Lasers, 2010, 37(4): 1108

    [5] Yuan Jinshe, Liu Yingdan, Pan Defang. Investigation on the In-Situ Spectroscopic Ellipsometry of GaN Films Grown on Sapphire Substrates by Molecular Beam Epitaxy[J]. Chinese Journal of Lasers, 2009, 36(s2): 378

    [6] Wu Haibin, He Sumei, Wang Changling. Experimental Research on the Mechanism of Causing Fast Luminous Attenuation of White Lamp-LED[J]. Acta Optica Sinica, 2009, 29(5): 1363

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    [8] Yuan Run, Wang Yawei, Cai Lan. Several Optical Approximate Model and Light Message DistributionCharacteristics of Red Blood Cells[J]. Chinese Journal of Lasers, 2009, 36(10): 2614

    [9] Hou Haihong, Shen Jian, Zhang Dawei, Fan Zhengxiu. Study on Surface Roughness of Substrates under Different Cleaning Techniques by Total Integrated Scatter[J]. Chinese Journal of Lasers, 2009, 36(6): 1559

    [10] Lu Baowen, Xu Xueke, Liu Guanghui, Hu Guohang, Liu Xiaofeng, Fan Zhengxiu. Genetic Analysis and Suppression of Multiple-Cavity-Induced Transmission Filters′ Defect[J]. Acta Optica Sinica, 2010, 30(7): 2149

    [11] Pan Yongqiang, Hang Lingxia. Optical Properties and Surface Roughness of TiO2 Thin Films Prepared by Using Oblique Angle Deposition[J]. Chinese Journal of Lasers, 2011, 38(2): 207001

    [12] Xing Chong, Huang Jiashou, Luo Shuo. Measurment of Turbid Media′s Backscattering Mueller Matrix[J]. Chinese Journal of Lasers, 2009, 36(10): 2587

    [13] Lu Weijie, Zhang Rongjun, Chen Yiming, Zheng Yuxiang, Cheng Xu, Li Chuanwen, Chen Liangyao. Design and Realization of Extensive Optical Thin Film Mapping Measurement Platform[J]. Chinese Journal of Lasers, 2009, 36(6): 1555

    [14] Cui Ji, Liu Ye, Li Yongqiang, Jiang Liyong, Wang Qinghua, Li Xiangyin, He Anzhi. Morphology Analysis and Light Scattering Properties Study on ZnO/TiO2 Composite Thin Films[J]. Chinese Journal of Lasers, 2011, 38(2): 207002

    Pan Yongqiang, Wu Zhensen, Hang Lingxia. Optical Thin Films Interfaces Roughness Cross-Correlated Properties and Light Scattering[J]. Chinese Journal of Lasers, 2008, 35(6): 916
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