Algorithms to Reduce Noise in CCD Using Line Overscan Data

MA Yuanyuan; LI Yandong; TANG Zunlie; LI Jin; ZHANG Na; LING Maozhen; HE Bin

doi:10.16818/j.issn1001-5868.2023121702

Journals >Semiconductor Optoelectronics >Volume 45 >Issue 2 >Page 206 > Article

Semiconductor Optoelectronics
Vol. 45, Issue 2, 206 (2024)

Algorithms to Reduce Noise in CCD Using Line Overscan Data

MA Yuanyuan, LI Yandong, TANG Zunlie, LI Jin..., ZHANG Na, LING Maozhen and HE Bin|Show fewer author(s)

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DOI: 10.16818/j.issn1001-5868.2023121702 Cite this Article

MA Yuanyuan, LI Yandong, TANG Zunlie, LI Jin, ZHANG Na, LING Maozhen, HE Bin. Algorithms to Reduce Noise in CCD Using Line Overscan Data[J]. Semiconductor Optoelectronics, 2024, 45(2): 206 Copy Citation Text

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References

[7] Panetta K, Bao L, Agaian S. Sequence-to-sequence similaritybased filter for image denoising[J]. IEEE Sensors J., 2016,16(11): 4380-4388.

[8] Janesick J. Charge Collection in Scientific Charge Coupled Devices[M]. Bellingham, WA, USA: SPIE Press, 2001:273-278.

[9] Yao P P, Tu B H, Xu S L, et al. Electro-optical performance characterization of charge coupled device for directional polarimetric camera[J]. Results in Optics, 2021, 3: 100055.

[11] Janesick J. Photon Transfer Curve[M]. Bellingham, WA,USA: SPIE Press, 2007: 49-71.

MA Yuanyuan, LI Yandong, TANG Zunlie, LI Jin, ZHANG Na, LING Maozhen, HE Bin. Algorithms to Reduce Noise in CCD Using Line Overscan Data[J]. Semiconductor Optoelectronics, 2024, 45(2): 206

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