• Acta Photonica Sinica
  • Vol. 51, Issue 10, 1014002 (2022)
Peng WANG1, Yaping XUAN1、2, Yilin XU1、2, Xiong SHEN1, Shunlin HUANG1、2, Jun LIU1、2、*, and Ruxin LI1、2
Author Affiliations
  • 1CAS Center for Excellence in Ultra-intense Laser Science,State Key Laboratory of High Field Laser Physics,Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,Shanghai 201800,China
  • 2Center of Materials Science and Optoelectronics Engineering,University of Chinese Academy of Sciences,Beijing 100049,China
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    DOI: 10.3788/gzxb20225110.1014002 Cite this Article
    Peng WANG, Yaping XUAN, Yilin XU, Xiong SHEN, Shunlin HUANG, Jun LIU, Ruxin LI. Applications of Femtosecond Four-wave Mixing in Ultrafast and Ultraintense Laser Technology(Invited)[J]. Acta Photonica Sinica, 2022, 51(10): 1014002 Copy Citation Text show less
    Schematic mechanism of negative CFWM sideband generation[18]
    Fig. 1. Schematic mechanism of negative CFWM sideband generation18
    Generation of 2D and 1D signal light[21]
    Fig. 2. Generation of 2D and 1D signal light21
    Experiment setup and signal properties[22]
    Fig. 3. Experiment setup and signal properties22
    Experiment setup[25]
    Fig. 4. Experiment setup25
    The intensity distribution of the signal light after the line polarizer[25]
    Fig. 5. The intensity distribution of the signal light after the line polarizer25
    Multicolor concentric ultrafast vortex beam[26]
    Fig. 6. Multicolor concentric ultrafast vortex beam26
    Interferogram of the generated signal light[26]
    Fig. 7. Interferogram of the generated signal light26
    Experiment setup[29]
    Fig. 8. Experiment setup29
    Broadband signal generation[29]
    Fig. 9. Broadband signal generation29
    Experimental setup for self-diffraction signal generation[30]
    Fig. 10. Experimental setup for self-diffraction signal generation30
    The temporal contrast of the input pulse and the signal[30]
    Fig. 11. The temporal contrast of the input pulse and the signal30
    Spectra at 30 different positions(the inset shows the center wavelengths measured at each position)[30]
    Fig. 12. Spectra at 30 different positions(the inset shows the center wavelengths measured at each position)30
    Spectra of compensated SD signal[30]
    Fig. 13. Spectra of compensated SD signal30
    Schematic of the setup[31]
    Fig. 14. Schematic of the setup31
    The generation of the multicolored sidebands[31]
    Fig. 15. The generation of the multicolored sidebands31
    The stability of the signal[31]
    Fig. 16. The stability of the signal31
    The angular compensation of the signal[31]
    Fig. 17. The angular compensation of the signal31
    The temporal contrast curves of the input pulse(solid line)and signal(dashed line)[31]
    Fig. 18. The temporal contrast curves of the input pulse(solid line)and signal(dashed line)31
    The experimental setup[38]
    Fig. 19. The experimental setup38
    The signal on the sCMOS[38]
    Fig. 20. The signal on the sCMOS38
    The measured temporal contrast[38]
    Fig. 21. The measured temporal contrast38
    Correlation traces by the TOAC and FOAC with a linear plot of intensity[38]
    Fig. 22. Correlation traces by the TOAC and FOAC with a linear plot of intensity38
    The temporal contrast of the 20 mJ laser pulse[38]
    Fig. 23. The temporal contrast of the 20 mJ laser pulse38
    The detector noise from the sCOMS and scattering noise from the SHG signals[38]
    Fig. 24. The detector noise from the sCOMS and scattering noise from the SHG signals38
    The temporal contrast measurement results[38]
    Fig. 25. The temporal contrast measurement results38
    The setup of the device[37]
    Fig. 26. The setup of the device37
    The correlation signal on the sCMOS[37]
    Fig. 27. The correlation signal on the sCMOS37
    The measured temporal contrast and the intensity of the noise[37]
    Fig. 28. The measured temporal contrast and the intensity of the noise37
    Principle of high dynamic temporal contrast characterization[39]
    Fig. 29. Principle of high dynamic temporal contrast characterization39
    The temporal contrast curves of all three pulses at three different pulse widths[39]
    Fig. 30. The temporal contrast curves of all three pulses at three different pulse widths39
    Schematic of SRSI-ETE device[39]
    Fig. 31. Schematic of SRSI-ETE device39
    Temporal contrast of the laser pulse with and without anti-saturated absorption effect[39]
    Fig. 32. Temporal contrast of the laser pulse with and without anti-saturated absorption effect39
    Temporal contrast curves of the input pulse with and without optical Kerr effect[39]
    Fig. 33. Temporal contrast curves of the input pulse with and without optical Kerr effect39
    Fourier transform spectral interferometry procedure[46]
    Fig. 34. Fourier transform spectral interferometry procedure46
    Principles of XPW,SD,TG
    Fig. 35. Principles of XPW,SD,TG
    Two-dimensional phase-mismatch pattern,the black solid line corresponds to zero phase mismatch[58]
    Fig. 36. Two-dimensional phase-mismatch pattern,the black solid line corresponds to zero phase mismatch58
    Experimental setup for SD-SRSI[58]
    Fig. 37. Experimental setup for SD-SRSI58
    Measurement results of the device [58]
    Fig. 38. Measurement results of the device 58
    Measurement results of the device [58]
    Fig. 39. Measurement results of the device 58
    SD spectra measured at three different positions on the beam,C0,C5,and C-5 [53]
    Fig. 40. SD spectra measured at three different positions on the beam,C0,C5,and C-5 53
    TG signal spectra at seven different points on the beam[59]
    Fig. 41. TG signal spectra at seven different points on the beam59
    Principle of TG-SRSI [59]
    Fig. 42. Principle of TG-SRSI 59
    Optical layout of AR-TG-SRSI [60]
    Fig. 43. Optical layout of AR-TG-SRSI 60
    Sketch of the AR-TG-SRSI[60]
    Fig. 44. Sketch of the AR-TG-SRSI60
    Measurement results of the device[60]
    Fig. 45. Measurement results of the device60
    Setup of enhanced TG-SRSI[62]
    Fig. 46. Setup of enhanced TG-SRSI62
    Characterization of femtosecond pulses at 84-MHz repetition rates [62]
    Fig. 47. Characterization of femtosecond pulses at 84-MHz repetition rates 62
    The schematic of FASI [64]
    Fig. 48. The schematic of FASI 64
    The layout of the device [64]
    Fig. 49. The layout of the device 64
    Measurement results of the device[64]
    Fig. 50. Measurement results of the device64
    GeometryPG(XPW)SDTG
    Sensitivity(multi-shot)~100 nJ~1 000 nJ~10 nJ
    Sensitivity(single shot)~1 μJ~10 μJ~0.1 μJ
    AdvantagesSelf-phase-matchingDeep UV capability

    Background free;Sensitive;

    Deep UV capability

    DisadvantagesRequire polarizersNon-self-phase-matchingThree beams
    Table 1. Comparison of XPW,SD,and TG processes57
    Peng WANG, Yaping XUAN, Yilin XU, Xiong SHEN, Shunlin HUANG, Jun LIU, Ruxin LI. Applications of Femtosecond Four-wave Mixing in Ultrafast and Ultraintense Laser Technology(Invited)[J]. Acta Photonica Sinica, 2022, 51(10): 1014002
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