• Semiconductor Optoelectronics
  • Vol. 41, Issue 6, 822 (2020)
WEN Jingchao*, WU Liqiang, ZHAO Yanfei, and YU Wang
Author Affiliations
  • [in Chinese]
  • show less
    DOI: 10.16818/j.issn1001-5868.2020.06.012 Cite this Article
    WEN Jingchao, WU Liqiang, ZHAO Yanfei, YU Wang. Identification Method of Refurbished Electronic Components Based on Optical Interferometry[J]. Semiconductor Optoelectronics, 2020, 41(6): 822 Copy Citation Text show less
    References

    [5] Stradley J, Karraker D. The electronic part supply chain and risks of counterfeit parts in defense applications[J]. IEEE Trans. on Components and Packaging Technologies, 2006, 29(3): 703705.

    CLP Journals

    [1] MAO Lulu, LIANG Lili, LIANG Jiyun. Phase Solution of Extremum Feature of Grating Projection Interferogram with Random Step Size[J]. Semiconductor Optoelectronics, 2022, 43(5): 942

    WEN Jingchao, WU Liqiang, ZHAO Yanfei, YU Wang. Identification Method of Refurbished Electronic Components Based on Optical Interferometry[J]. Semiconductor Optoelectronics, 2020, 41(6): 822
    Download Citation