• Electronics Optics & Control
  • Vol. 23, Issue 7, 79 (2016)
WANG Yong-nan11, MU Xi-hui22, NIU Yue-ting22, and WANG Qi11
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 0.3969/j.issn.1671-637x.2016.07.017 Cite this Article
    WANG Yong-nan1, MU Xi-hui2, NIU Yue-ting2, WANG Qi1. Storage Life Prediction of a Certain Accelerometer Based on Isotonic Regression[J]. Electronics Optics & Control, 2016, 23(7): 79 Copy Citation Text show less
    References

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    [3] SUK J B, KIM S J, PARK J I, et al. Lifetime prediction through accelerated degradation testing of membrane electrode assemblies in direct methanol fuel cells[J]. International Journal of Hydrogen Energy, 2010, 35(17): 9166-9167.

    [4] WOHLGEMUTH J H, SARAH K.Using accelerated testing to predict module reliability[C]//37th IEEE Photovoltaic Specialists Conference (PVSC 11), Seattle, 2011: 19-24.

    [5] LI X Y, JIANG T M.Optimal design for step-stress acce-lerated degradation with competing failure modes[C]//Annual Reliability and Maintainability Symposium, 2009: 64-68.

    [10] NARAYANASWAMY B, ERIC B, MARIA K. Order restricted inference for exponential step-stress models[J]. IEEE Transactions on Reliability, 2009, 58(1): 132-142.

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    WANG Yong-nan1, MU Xi-hui2, NIU Yue-ting2, WANG Qi1. Storage Life Prediction of a Certain Accelerometer Based on Isotonic Regression[J]. Electronics Optics & Control, 2016, 23(7): 79
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