Automatically Profiling Refractive Index of a Large Sample by Using Reflection Method

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Photonica Sinica >Volume 32 >Issue 7 >Page 856 > Article

Acta Photonica Sinica
Vol. 32, Issue 7, 856 (2003)

Automatically Profiling Refractive Index of a Large Sample by Using Reflection Method

[in Chinese]^1、2, [in Chinese]^1、2, [in Chinese]¹, and [in Chinese]¹

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Automatically Profiling Refractive Index of a Large Sample by Using Reflection Method[J]. Acta Photonica Sinica, 2003, 32(7): 856 Copy Citation Text

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Abstract

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Automatically Profiling Refractive Index of a Large Sample by Using Reflection Method[J]. Acta Photonica Sinica, 2003, 32(7): 856

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