• Acta Photonica Sinica
  • Vol. 49, Issue 10, 1031001 (2020)
Man-yu WU and Shui-ping HUANG
Author Affiliations
  • School of Physical Science and Technology,Ningbo University,Ningbo,Zhejiang 315211,China
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    DOI: 10.3788/gzxb20204910.1031001 Cite this Article
    Man-yu WU, Shui-ping HUANG. Preparation of Zr-based Thin Film Metallic Glass and Determination of Its Optical Constant[J]. Acta Photonica Sinica, 2020, 49(10): 1031001 Copy Citation Text show less
    Reflection and transmission of single-layer film system
    Fig. 1. Reflection and transmission of single-layer film system
    X-ray diffraction pattern of Zr-based thin film metallic glass
    Fig. 2. X-ray diffraction pattern of Zr-based thin film metallic glass
    Fitting results of the ellipsometric parameter Ψ of Zr-based thin film metallic glass
    Fig. 3. Fitting results of the ellipsometric parameter Ψ of Zr-based thin film metallic glass
    Fitting results of the ellipsometic parameter Δ of Zr-based thin film metallic glass
    Fig. 4. Fitting results of the ellipsometic parameter Δ of Zr-based thin film metallic glass
    Real part (ε1) and imaginary part (ε2) of the dielectric constant of Zr-based thin film metallic glass
    Fig. 5. Real part (ε1) and imaginary part (ε2) of the dielectric constant of Zr-based thin film metallic glass
    Refractive index n and extinction coefficient k of Zr-based thin film metallic glass
    Fig. 6. Refractive index n and extinction coefficient k of Zr-based thin film metallic glass
    GIXRR measurement and fitting curves of Zr-based thin film metallic glass
    Fig. 7. GIXRR measurement and fitting curves of Zr-based thin film metallic glass
    εjAmj/eVBrj/eVEnj/eVd/nm

    0.310

    15.8640.21708.598
    29.0651.8091.506
    Table 1. The fitting parameters of Drude-Lorentz double oscillator dispersion model and the thickness of film
    Man-yu WU, Shui-ping HUANG. Preparation of Zr-based Thin Film Metallic Glass and Determination of Its Optical Constant[J]. Acta Photonica Sinica, 2020, 49(10): 1031001
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