• Infrared Technology
  • Vol. 45, Issue 12, 1346 (2023)
Guohui XU, Hongwei XIE, Tongfa LYU, Xin MOU, Mingzheng BAO, and Chao LYU
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  • [in Chinese]
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    DOI: Cite this Article
    XU Guohui, XIE Hongwei, LYU Tongfa, MOU Xin, BAO Mingzheng, LYU Chao. Assessment Method of Ultraviolet Spot Area for Insulators Based on Improved ANFIS[J]. Infrared Technology, 2023, 45(12): 1346 Copy Citation Text show less
    References

    [10] LI Heming, DAI Rijun, LI Man. Insulator ultraviolet discharge feature extraction based on level set[C]//IEEE International Conference on Electrical and Control Engineering, 2011: 2283-2286.

    XU Guohui, XIE Hongwei, LYU Tongfa, MOU Xin, BAO Mingzheng, LYU Chao. Assessment Method of Ultraviolet Spot Area for Insulators Based on Improved ANFIS[J]. Infrared Technology, 2023, 45(12): 1346
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