• Journal of Atmospheric and Environmental Optics
  • Vol. 18, Issue 2, 141 (2023)
PAN Yan1、2, LI Xin1、*, LI Zhaozhou3, ZHANG Quan1, and ZHANG Yanna1
Author Affiliations
  • 1Key Laboratory of Optical Calibration and Characterization, Anhui Institute of Optics and Fine Mechanics, HFIPS,Chinese Academy of Sciences, Hefei 230031, China
  • 2University of Science and Technology of China, Hefei 230026, China
  • 3China Center for Resources Satellite Data and Application, Beijing 100094, China
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    DOI: 10.3969/j.issn.1673-6141.2023.02.006 Cite this Article
    Yan PAN, Xin LI, Zhaozhou LI, Quan ZHANG, Yanna ZHANG. Automatic measurement method of target reflectivity at Songshan Remote Sensing Calibration Field[J]. Journal of Atmospheric and Environmental Optics, 2023, 18(2): 141 Copy Citation Text show less
    Aerial view of Songshan Remote Sensing Calibration Field
    Fig. 1. Aerial view of Songshan Remote Sensing Calibration Field
    Model (a) and picture (b) of automated reflectance monitoring spectrometer
    Fig. 2. Model (a) and picture (b) of automated reflectance monitoring spectrometer
    Model (a) and picture (b) of visible-shortwave infrared hyperspectral irradiance meter
    Fig. 3. Model (a) and picture (b) of visible-shortwave infrared hyperspectral irradiance meter
    Verification process of the reflectance accuracy
    Fig. 4. Verification process of the reflectance accuracy
    Measurement comparison of two methods in Area Ⅰ. (a) Comparison of two reflectance; (b) measurement deviation
    Fig. 5. Measurement comparison of two methods in Area Ⅰ. (a) Comparison of two reflectance; (b) measurement deviation
    Measurement comparison of two methods in Area Ⅱ. (a) Comparison of two reflectance; (b) measurement deviation
    Fig. 6. Measurement comparison of two methods in Area Ⅱ. (a) Comparison of two reflectance; (b) measurement deviation
    Measurement comparison of two methods in Area Ⅲ. (a) Comparison of two reflectance; (b) measurement deviation
    Fig. 7. Measurement comparison of two methods in Area Ⅲ. (a) Comparison of two reflectance; (b) measurement deviation
    All day total irradiance in different bands measured by HIM-002 on October 29, 2019
    Fig. 8. All day total irradiance in different bands measured by HIM-002 on October 29, 2019
    All day total-irradiance of HIM-002 in different bands. (a) June 3, 2020; (b) July 27, 2020
    Fig. 9. All day total-irradiance of HIM-002 in different bands. (a) June 3, 2020; (b) July 27, 2020
    Target reflected radiance data measured by ARM002 at different time
    Fig. 10. Target reflected radiance data measured by ARM002 at different time
    The changes of reflectance in the Area Ⅱ. (a) In the whole bands; (b) some wavelengths
    Fig. 11. The changes of reflectance in the Area Ⅱ. (a) In the whole bands; (b) some wavelengths
    The changes of reflectance in the Area Ⅲ. (a) In the whole bands; (b) some wavelengths
    Fig. 12. The changes of reflectance in the Area Ⅲ. (a) In the whole bands; (b) some wavelengths
    The standard deviation of reflectance in the field. (a) Area Ⅱ; (b) Area Ⅲ
    Fig. 13. The standard deviation of reflectance in the field. (a) Area Ⅱ; (b) Area Ⅲ
    InstrumentARMSHIM
    Spectral range/nm350~1600400~2400

    FWHM

    ≤ 4 nm(@350~950 nm)

    ≤ 15 nm(@950~1600 nm)

    ≤ 4 nm (@400~950 nm)

    ≤ 15 nm (@950~1650 nm)

    ≤ 20 nm (@1650~2400 nm)

    Functions

    1) to automatically measure the reflected

    radiance of surface in a continuous spectrum;

    2) to automatically observe

    in the wild;

    3) the function of self-cleaning

    reference board;

    4) self-calibration based on the

    reference board.

    1) to automatically measure

    the total irradiance;

    2) to automatically measure the

    sky light diffuse irradiance;

    3) to automatically obtain the

    direct solar irradiance;

    4) to automatically obtain the ratio

    between total and diffuse irradiance.

    Data transmission4G4G
    Operating temperature/℃-30~+60-30~+60
    Table 1. Main parameters and functions of ARMS and HIM
    Yan PAN, Xin LI, Zhaozhou LI, Quan ZHANG, Yanna ZHANG. Automatic measurement method of target reflectivity at Songshan Remote Sensing Calibration Field[J]. Journal of Atmospheric and Environmental Optics, 2023, 18(2): 141
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