Author Affiliations
School of Mechanical Engineering, Nanjing University of Science and Technology, Nanjing 210094, Jiangsu, Chinashow less
Fig. 1. Diagram of data acquisition equipment
Fig. 2. Model and sizes of experimental samples. (a) Overall size of sample; (b) size of support cross section of samples 1 and 2; (c) size of support cross section of samples 3 and 4; (d) size of support cross section of sample 5
Fig. 3. Division method of X-Y sections of samples
Fig. 4. Measurement method of sample warp deformation. (a) Positions of nine measurement points; (b) definition of warp deformation
Fig. 5. Physical pictures of samples and corresponding light intensity mapping diagrams of overhanging bottom layer. (a) Sample S80-1; (b) sample S80-2; (c) sample S25-1; (d) sample S25-2; (e) sample S20
Fig. 6. Deformation amounts of samples
Fig. 7. Average light intensity corresponding to warping region (Y=0‒1 mm and Y=41‒42 mm) of layer 46
Fig. 8. Z-Y cross sections of samples and average light intensity distribution curves of overhanging first layers of samples along Y direction. Z-Y cross sections of samples (a1) S80, (a2) S25, and (a3) S20; average light intensity distribution curves of samples (b) S80-1, (c) S80-2, (d) S25-1, (e) S25-2, and (f) S20
Fig. 9. Z-Y cross sections of samples and interlayer evolution of light intensity in samples. Z-Y cross sections of samples (a1) S80, (a2) S25, and (a3) S20; interlayer evolution of light intensity in samples (b) S80-1, (c) S80-2, (d) S25-1, (e) S25-2, and (f) S20
Sample index | Middle support width /mm | Tooth width /mm | Total contact area between supports /mm² |
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S80-1 | 4 | 1 | 80 | S80-2 | S25-1 | 2 | 0.5 | 25 | S25-2 | S20 | 1 | 0.5 | 20 |
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Table 1. Dimensions of specimen
Process parameter | Content |
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1‒36 layer | 37‒69 layer |
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Laser power /W | 195 | 280 | Scanning speed /(mm/s) | 1200 | 1400 | Hatch distance /μm | 105 | Scan strategy | Zig-zag scaning | Layer thickness /μm | 30 |
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Table 2. Forming parameters of samples