• High Power Laser and Particle Beams
  • Vol. 31, Issue 7, 70007 (2019)
Chen Yuhao1、*, Xie Yanzhao1, Liu Minzhou1, Gao Chong2, Li Meng3, Gong Shaoyan2, and Zhou Jianhui2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.11884/hplpb201931.190184 Cite this Article
    Chen Yuhao, Xie Yanzhao, Liu Minzhou, Gao Chong, Li Meng, Gong Shaoyan, Zhou Jianhui. Analysis of high-altitude electromagnetic effect models on power system[J]. High Power Laser and Particle Beams, 2019, 31(7): 70007 Copy Citation Text show less
    References

    [1] Nitsch D, Camp M, Sabath F, et al. Susceptibility of some electronic equipment to HPEM threats[J]. IEEE Trans Electromagn Compat, 2004, 46(3):380-389.

    [2] Camp M, Gerth H, Garbe H, et al. Predicting the breakdown behavior of microcontrollers under EMP/UWB impact using a statistical analysis[J]. IEEE Trans Electromagn Compat, 2004, 46(3):368-379.

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    [16] Florkowski M, Furgal J, Pajak P. Analysis of fast transient voltage distributions in transformer windings under different insulation conditions[J]. IEEE Trans Dielectrics and Electrical Insulation, 2012, 19(6):1991-1998.

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    [18] LiKejie, Xie Yanzhao, Chen Yuhao, et al. Multinomial regression model for the evaluation of multi-level effects caused by high-power electromagnetic environments[J]. IEEE Trans Electromagn Compat, 2019, 61(1):149-156.

    [19] LiuYu, Han Feng, Wang Jianguo, et al. Vulnerability assessment of a multistate component for IEMI based on a Bayesian method[J]. IEEE Trans Electromagn Compat, 2019, 61(2):467-475.

    Chen Yuhao, Xie Yanzhao, Liu Minzhou, Gao Chong, Li Meng, Gong Shaoyan, Zhou Jianhui. Analysis of high-altitude electromagnetic effect models on power system[J]. High Power Laser and Particle Beams, 2019, 31(7): 70007
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