• Chinese Journal of Lasers
  • Vol. 37, Issue 12, 3140 (2010)
Liu Chunling1、*, Wang Chunwu1, Wang Guangde1, Qiao Zhongliang2, Jiang Wenlong1, Yao Yanping1, and Chen Wanjin3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3788/cjl20103712.3140 Cite this Article Set citation alerts
    Liu Chunling, Wang Chunwu, Wang Guangde, Qiao Zhongliang, Jiang Wenlong, Yao Yanping, Chen Wanjin. Process Investigation of H4 Thin Film Prepared by Electron Beam Evaporation and Application on Laser Diodes Cavity Coatings[J]. Chinese Journal of Lasers, 2010, 37(12): 3140 Copy Citation Text show less

    Abstract

    H4 thin films (which is a compound of titanium oxide and lanthanum oxide,chemical formula is LaTiO3) have been prepared by the ion assisted electron beam depositing technology. The effect of the substrate temperature and oxygen gas stress influencing on the optical characteristics of H4 thin films have been investigated.It is found that the refractive index n dramatically increases with the substrate temperature building-up,the value of n808 nm is 2.14 at 100 ℃ of the substrate temperature; the extinction coefficient k has changed little with the oxygen pressure reduction, the value of k400 nm is 2×10-4 at 2.67×10-2 Pa of the oxygen pressure. The optimized parameters are applied to the preparation of high reflection mirror of 808 nm lasers, compared with the lasers using titanium oxide as HR films, have obtained a little better laser output characteristics. Therefore, it is a kind of new method of completely feasible that H4 thin films are used as high reflectivity facet coatings of laser diodes.
    Liu Chunling, Wang Chunwu, Wang Guangde, Qiao Zhongliang, Jiang Wenlong, Yao Yanping, Chen Wanjin. Process Investigation of H4 Thin Film Prepared by Electron Beam Evaporation and Application on Laser Diodes Cavity Coatings[J]. Chinese Journal of Lasers, 2010, 37(12): 3140
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