• Chinese Optics Letters
  • Vol. 6, Issue 10, 732 (2008)
Man Wu1、2、*, Weiqing Huan1, and Lingling Wan1
Author Affiliations
  • 1School of Physics and Microelectronic Science, Hunan University, Changsha 41008
  • 2Changde Vocational Technical College, Changde 41500
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    DOI: 10.3788/COL20080610.0732 Cite this Article Set citation alerts
    Man Wu, Weiqing Huan, Lingling Wan. Propagation characteristics of the silica and silicon subwavelength-diameter hollow wire waveguides[J]. Chinese Optics Letters, 2008, 6(10): 732 Copy Citation Text show less

    Abstract

    The basic propagation properties of the silica and silicon subwavelength-diameter hollow wire waveguides have been investigated by comparison. It shows that the silica and silicon subwavelength-diameter hollow wire waveguides have some interesting properties, such as enhanced evanescent field in the cladding, enhanced intensity in the hollow core, and large waveguide dispersion. For the different confinement ability, the enhanced field in the hollow core and cladding of the silica subwavelength-diameter hollow wire is much stronger than that of the silicon one for the same size.
    Man Wu, Weiqing Huan, Lingling Wan. Propagation characteristics of the silica and silicon subwavelength-diameter hollow wire waveguides[J]. Chinese Optics Letters, 2008, 6(10): 732
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