• Acta Photonica Sinica
  • Vol. 50, Issue 3, 119 (2021)
Xiuwei YANG1、2、3, Dehai ZHANG1, Siyu LIU1、2, Xiangdong LI3, and Chuanwen XU3
Author Affiliations
  • 1Key Laboratory of Microwave Remote Sensing, National Space Science Center, Chinese Academy of Sciences, Beijing0090, China
  • 2University of Chinese Academy of Sciences, Beijing100049, China
  • 3Key Laboratory of UWB & THz of Shandong Academy of Sciences, Institute of Automation, Qilu University of Technology (Shandong Academy of Sciences), Jinan25001, China
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    DOI: 10.3788/gzxb20215003.0312001 Cite this Article
    Xiuwei YANG, Dehai ZHANG, Siyu LIU, Xiangdong LI, Chuanwen XU. Terahertz Nondestructive Detection of the Hidden Layer in Multilayer Medium[J]. Acta Photonica Sinica, 2021, 50(3): 119 Copy Citation Text show less
    No.MethodThickness/mmError/%Refravtive indexError/%
    1Mesured value0.20011.6700.8
    Estimated value0.2021.684
    2Mesured value0.2002.51.67012.8
    Estimated value0.2051.885
    3Mesured value0.20041.67012.8
    Estimated value0.2081.884
    4Mesured value0.2000.151.6701.5
    Estimated value0.2031.695
    5Mesured value0.20011.67012.7
    Estimated value0.2021.882
    6Mesured value0.20011.6700.9
    Estimated value0.1981.685
    7Mesured value0.20021.6700.6
    Estimated value0.2041.680
    8Mesured value0.2000.51.6700.5
    Estimated value0.2011.679
    Table 1. The sample thickness, refractive index and quantitative error were obtained by genetic algorithm
    Xiuwei YANG, Dehai ZHANG, Siyu LIU, Xiangdong LI, Chuanwen XU. Terahertz Nondestructive Detection of the Hidden Layer in Multilayer Medium[J]. Acta Photonica Sinica, 2021, 50(3): 119
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