Double-Resolution Wave Plate Measurement Based on Equivalent Components and Phase Compensation

Qianghua Chen; Duo Shao; Fuming Liu; Yu Guan; Lü Hongbo; Lina Si; Hongjuan Yan; Zhaoliang Dou

doi:10.3788/CJL231157

[1] Tan Y J, Zhang L, Sun T X et al. Polarization compensation method based on the wave plate group in phase mismatch for free-space quantum key distribution[J]. EPJ Quantum Technology, 10, 6(2023).

[2] Lin S T, Le Q H, Chen S H et al. Heterodyne polariscope for measuring the principal angle and phase retardation of stressed plastic substrates[J]. Measurement, 175, 109096(2021).

[3] Chen Q H, Zhou S, Ding J H et al. Three-dimensional temperature field measurement based on multi-step phase shift method and polarization interference optical tomography optical path[J]. Acta Optica Sinica, 42, 0712004(2022).

[4] Chen K H, Tseng J T, Yeh C H et al. Alternative method for measuring the phase retardation and fast axis of a wave plate[J]. Optical Review, 26, 652-658(2019).

[5] Chen K H, Lin C H, Liu P C. An interferometric method for simultaneously determination the phase retardation and fast-axis azimuth angle of a wave plate[J]. Journal of Modern Optics, 67, 992-997(2020).

[6] Zeng A J, Li F Y, Zhu L L et al. Simultaneous measurement of retardance and fast axis angle of a quarter-wave plate using one photoelastic modulator[J]. Applied Optics, 50, 4347-4352(2011).

[7] Chen X J, Yan L S, Yao X S. Waveplate analyzer using binary magneto-optic rotators[J]. Optics Express, 15, 12989-12994(2007).

[8] Xie C K, Zeng A J, Huang H J et al. Real-time measurement of retardation and fast axis azimuth for wave plates[J]. Journal of Optical Technology, 82, 294-297(2015).

[9] Wang W, Su F F, Gao S et al. Method for measurement of phase retardation of a wave plate based on spectral interference technology[J]. Laser & Optoelectronics Progress, 60, 0112004(2023).

[10] Zhang P, Liu N, Zhao S J et al. Measurement method for optical retardation based on the phase difference effect of laser feedback fringes[J]. Applied Optics, 54, 204-209(2015).

[11] Liu W X, Liu M, Zhang S L. Method for the measurement of phase retardation of any wave plate with high precision[J]. Applied Optics, 47, 5562-5569(2008).

[12] Gu H G, Chen X G, Zhang C W et al. Study of the retardance of a birefringent waveplate at tilt incidence by Mueller matrix ellipsometer[J]. Journal of Optics, 20, 015401(2018).

[13] Chen Q H, Liu B C, He Y X et al. Phase retardation measurement of an arbitrary wave plate based on magneto-optical modulating and residue detecting of the base frequency component of the signal[J]. Optics Letters, 43, 4514-4517(2018).

[14] Gu H G, Chen X G, Jiang H et al. Accurate alignment of optical axes of a biplate using a spectroscopic Mueller matrix ellipsometer[J]. Applied Optics, 55, 3935-3941(2016).