• Optics and Precision Engineering
  • Vol. 13, Issue 6, 658 (2005)
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of piezoelectric properties of PZT films by laser Doppler technique[J]. Optics and Precision Engineering, 2005, 13(6): 658 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of piezoelectric properties of PZT films by laser Doppler technique[J]. Optics and Precision Engineering, 2005, 13(6): 658
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