S-parameters Measurement of Semiconductor Microwave Devices by Ultrashort Optical Pulses

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Chinese Journal of Lasers >Volume 25 >Issue 6 >Page 495 > Article

Chinese Journal of Lasers
Vol. 25, Issue 6, 495 (1998)

S-parameters Measurement of Semiconductor Microwave Devices by Ultrashort Optical Pulses

[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. S-parameters Measurement of Semiconductor Microwave Devices by Ultrashort Optical Pulses[J]. Chinese Journal of Lasers, 1998, 25(6): 495 Copy Citation Text

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Abstract

The principle to measure S-parameters of microwave devices with ultrashort optical pulses has been described. The measuring system with a maximum frequency up to 100 GHz has been developed. We have measured the devices with a frequency of 36 GHz. The results agree well with those measured by using a network analyzer.

Keywords

photoconduction switch S-parameter ultrashort optical pulses

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