• Semiconductor Optoelectronics
  • Vol. 42, Issue 6, 849 (2021)
DONG Bin, HE Chenguang, WANG Changan, LI Qixin..., LI Yelin, LIU Ningyang, ZHAO Wei and CHEN Zhitao|Show fewer author(s)
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    DOI: 10.16818/j.issn1001-5868.2021102203 Cite this Article
    DONG Bin, HE Chenguang, WANG Changan, LI Qixin, LI Yelin, LIU Ningyang, ZHAO Wei, CHEN Zhitao. Effect of Oxygen Partial Pressure During Sputtering on Structural and Optical Properties of β-Ga2O3 Thin Films[J]. Semiconductor Optoelectronics, 2021, 42(6): 849 Copy Citation Text show less
    References

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    [6] Dong L, Jia R, Xin B, et al. Effects of post-annealing temperature and oxygen concentration during sputtering on the structural and optical properties of β-Ga2O3 films[J]. J. Vac. Sci. Technol. A, 2016, 34(6): 060602.

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    DONG Bin, HE Chenguang, WANG Changan, LI Qixin, LI Yelin, LIU Ningyang, ZHAO Wei, CHEN Zhitao. Effect of Oxygen Partial Pressure During Sputtering on Structural and Optical Properties of β-Ga2O3 Thin Films[J]. Semiconductor Optoelectronics, 2021, 42(6): 849
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