Junshan Xiu, Shiming Liu, Kunkun Wang, Shenggui Fu, Tao Wang, Yunyan Liu. Analytical Investigation of Cu(In, Ga)Se2 Thin Films Using Laser Induced reakdown Spectroscopy Technology[J]. Chinese Journal of Lasers, 2018, 45(12): 1211002
- Chinese Journal of Lasers
- Vol. 45, Issue 12, 1211002 (2018)
Fig. 1. Diagram of LIBS experimental set-up for detecting CIGS thin film
Fig. 2. XRD spectrum of CIGS thin film
Fig. 3. LIBS spectra of CIGS thin film. (a) Spectral lines of Cu, In and Ga; (b) spectral lines of Cu I 327.39 nm at various working pressures
Fig. 4. Curves of LIBS intensity ratio and (a) xCu/x(In+Ga) or (b) xGa/x(In+Ga)
Fig. 5. LIBS intensity ratio of analytical spectral line of CIGS thin film deposited at various pressures
Fig. 6. Transmittance of CIGS thin films deposited at various pressures
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Table 1. EDS analysis results of CIGS thin film deposited at various working pressures
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Table 2. LIBS spectral lines of target elements in CIGS thin film
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