• Chinese Optics Letters
  • Vol. 12, Issue 10, 102702 (2014)
Gu Lei1, Li Lin1, Qiao Zhongliang1, Kong Lingyi2, Yuan Huibo1, Liu Yang1, Dai Yin1, Bo Baoxue1, and Liu Guojun1
Author Affiliations
  • 1National Key Lab of High Power Semiconductor Lasers, Changchun University of Science and Technology, Changchun, Jilin 130022, China
  • 2AIXTRON China Limited, Shanghai 200052, China
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    DOI: 10.3788/col201412.102702 Cite this Article Set citation alerts
    Gu Lei, Li Lin, Qiao Zhongliang, Kong Lingyi, Yuan Huibo, Liu Yang, Dai Yin, Bo Baoxue, Liu Guojun. High-strain InGaAs/GaAs quantum well grown by MOCVD[J]. Chinese Optics Letters, 2014, 12(10): 102702 Copy Citation Text show less

    Abstract

    High-strain InGaAs/GaAs quantum wells (QWs) are grown by low-pressure metal-organic chemical vapor deposition (LP-MOCVD). Photoluminescence (PL) at room temperature is applied for evaluation of the optical property. The influence of growth temperature, V/III ratio, and growth rate on PL characteristic are investigated. It is found that the growth temperature and V/III ratio have strong effects on the peak wavelength and PL intensity. The full-width at half-maximum (FWHM) of PL peak increases with higher growth rate of InGaAs layer. The FWHM of the PL peak located at 1039 nm is 20.1 meV, which grows at 600 °C with V/III ratio of 42.7 and growth rate of 0.96 mm/h.
    Gu Lei, Li Lin, Qiao Zhongliang, Kong Lingyi, Yuan Huibo, Liu Yang, Dai Yin, Bo Baoxue, Liu Guojun. High-strain InGaAs/GaAs quantum well grown by MOCVD[J]. Chinese Optics Letters, 2014, 12(10): 102702
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