• Chinese Optics Letters
  • Vol. 13, Issue 9, 091404 (2015)
Wenwen Liu1,2, Chaoyang Wei1,*, Kui Yi1, and Jianda Shao1
Author Affiliations
  • 1Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Graduate School of Chinese Academy of Sciences, Beijing 100039, China
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    DOI: 10.3788/COL201513.091404 Cite this Article Set citation alerts
    Wenwen Liu, Chaoyang Wei, Kui Yi, Jianda Shao, "Multiscale analysis of single- and multiple-pulse laser-induced damages in HfO2/SiO2 multilayer dielectric films at 532 nm," Chin. Opt. Lett. 13, 091404 (2015) Copy Citation Text show less
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    Data from CrossRef

    [5] Ying Zhang, Jilin Zheng, Yanzhi Wang, Jiaoling Zhao, Shuangchen Ruan. Design and fabrication of multilayer dielectric film for combination device spatial filter. Optik, 181, 528(2019).

    Wenwen Liu, Chaoyang Wei, Kui Yi, Jianda Shao, "Multiscale analysis of single- and multiple-pulse laser-induced damages in HfO2/SiO2 multilayer dielectric films at 532 nm," Chin. Opt. Lett. 13, 091404 (2015)
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