• Acta Photonica Sinica
  • Vol. 51, Issue 6, 0631001 (2022)
Jilong TANG1, Xiongwei XU1, Tianxiang CHEN2、*, Na GAO2, Jiewei CAO2, and Lin LI3
Author Affiliations
  • 1State Key Laboratory of High Power Semiconductor Laser,Changchun University of Science and Technology,Changchun 130022,China
  • 2Particle Astrophysics Division,Institute of High Energy Physics,Chinese Academy of Sciences,Beijing 100049,China
  • 3College of Mathematics and Physics,Beijing University of Chemical Technology,Beijing 100029,China
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    DOI: 10.3788/gzxb20225106.0631001 Cite this Article
    Jilong TANG, Xiongwei XU, Tianxiang CHEN, Na GAO, Jiewei CAO, Lin LI. Preparation of Self-supporting Al Filter[J]. Acta Photonica Sinica, 2022, 51(6): 0631001 Copy Citation Text show less
    Self-supporting Al filter prepared by two release agents
    Fig. 1. Self-supporting Al filter prepared by two release agents
    Calibration sample
    Fig. 2. Calibration sample
    Al film thickness calibration result
    Fig. 3. Al film thickness calibration result
    SEM images of Al filter
    Fig. 4. SEM images of Al filter
    Pinholes of Al filter
    Fig. 5. Pinholes of Al filter
    The transmittance of Al filters prepared by different release agents in ultraviolet,visible and infrared bands
    Fig. 6. The transmittance of Al filters prepared by different release agents in ultraviolet,visible and infrared bands
    Comparison of transmittance between 80 nm self-supporting Al filter and 400 nm PI + 80 nm Al filter
    Fig. 7. Comparison of transmittance between 80 nm self-supporting Al filter and 400 nm PI + 80 nm Al filter
    The transmittance of Al filter prepared with two kinds of release agents in soft X-ray band and the comparison with the theoretical value
    Fig. 8. The transmittance of Al filter prepared with two kinds of release agents in soft X-ray band and the comparison with the theoretical value
    Comparison between the measured and theoretical values of the filter in the energy range of 50~250 eV
    Fig. 9. Comparison between the measured and theoretical values of the filter in the energy range of 50~250 eV
    XPS test results of Al filters prepared by two release agents
    Fig. 10. XPS test results of Al filters prepared by two release agents
    SampleNameBending energy peakPeak area/(count·s-1·eV)
    AZ50XTC1s285.03651 118.28
    O1s533.06288 188.34
    Al2p73.313 736.61
    PVAC1s285.03609 719.20
    O1s533.06739 981.45
    Al2p74.273 072.78
    Table 1. The peak areas of C,O and Al elements in the two samples
    Jilong TANG, Xiongwei XU, Tianxiang CHEN, Na GAO, Jiewei CAO, Lin LI. Preparation of Self-supporting Al Filter[J]. Acta Photonica Sinica, 2022, 51(6): 0631001
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