[1] G. N. Strauss, W. Lechner, and H. K. Pulker, Thin Solid Films 351, 53 (1999).

[2] J. Y. Zhang, I. W. Boyd, V. Dusastre, and D. E. Williams, J. Phys. D 32, L91 (1999).

[3] T. W. Walker, A. H. Guenther, and P. E. Nielsen, IEEE J. Quantum Electron. 17, 2041 (1981).

[4] J.-Y. Natoli, B. Bertussi, and M. Commandre, Opt. Lett. 30, 1315 (2005).

[5] H. Kouta, Appl. Opt. 38, 545 (1999).

[6] Y. Zhao, Y. Wang, H. Gong, J. Shao, and Z. Fan, Appl. Surf. Sci. 210, 353 (2003).

[7] ISO 11254-1 Lasers and Laser-Related Equipment - Determination of Laser-Induced Damage Threshold of Optical Surfaces (2000) Part 1: 1-on-1 test.

[8] L. Yuan, Y. Zhao, G. Shang, C. Wang, H. He, J. Shao, and Z. Fan, J. Opt. Soc. Am. B 24, 538 (2007).

[9] I. Kim, J.-S. Kim, O.-S. Kwon, S.-T. Ahn, J.-S. Chun, and W.-J. Lee, J. Electron. Mater. 24, 1435 (1995).

[10] A. Pignolet, G. M. Rao, and S. B. Krupanidhi, Thin Solid Films 258, 230 (1995).

[11] C. R. Wolfe, M. R. Kozlowski, J. H. Campbell, F. Rainer, A. J. Morgan, and R. P. Gonzales, Proc. SPIE 801, 360 (1989).

[12] Y. A. Zhao, J. D. Shao, H. He, and Z. Fan, Proc. SPIE 5991, 599117 (2005).

[13] T. W. Walker, A. H. Guenther, and P. Nielsen, IEEE J. Quantum Electron. 17, 2053 (1981).