• Electronics Optics & Control
  • Vol. 27, Issue 10, 105 (2020)
XIE Wenguang1、2, WANG Kenian1、2, ZHANG Xiaochen2, and WU Kang2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2020.10.021 Cite this Article
    XIE Wenguang, WANG Kenian, ZHANG Xiaochen, WU Kang. Design and Simulation of Anti-Single-Event-Upset in AFDX Switch Based on FPGA[J]. Electronics Optics & Control, 2020, 27(10): 105 Copy Citation Text show less
    References

    [2] CESCHIA M. VIOLANTE M. REORDA M S. et al.Identification and classification of single-event upsets in the configuration memory of SRAM-based FPGAs[J].IEEE Transactions on Nuclear Science. 2003. 50(6):2088-2094.

    [4] STERPONE L. VIOLANTE M.A new analytical approach to estimate the effects of SEUs in TMR architectures implemented through SRAM-based FPGAs[J].IEEE Tran-sactions on Nuclear Science. 2005. 52(6):2217-2223.

    [5] BARAZA J C. GRACIA J. BLANC S. et al.Enhancement of fault injection techniques based on the modification of VHDL code[J].IEEE Transactions on Very Large Scale Integration Systems. 2008. 16(6):693-706.

    [6] ALDERIGHI M. D'ANGELO S. MANCINI M. et al.A fault injection tool for SRAM-based FPGAs[C]//The 9th International On-Line Testing Symposium. IEEE. 2003:129-133.

    [7] ZHANG R S. XIAO L Y. LI J.A fast and accurate fault injection platform for SRAM-based FPGAs[C]//The 12th International Conference on ASIC. IEEE. 2017:435-438.

    [9] Aeronautical Radio Inc.Aircraft data network-Part 7:Avionics full-duplex switched Ethernet network[S].[S.l.]ARINC. 2005.

    XIE Wenguang, WANG Kenian, ZHANG Xiaochen, WU Kang. Design and Simulation of Anti-Single-Event-Upset in AFDX Switch Based on FPGA[J]. Electronics Optics & Control, 2020, 27(10): 105
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