• Electronics Optics & Control
  • Vol. 27, Issue 10, 105 (2020)
XIE Wenguang1、2, WANG Kenian1、2, ZHANG Xiaochen2, and WU Kang2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    DOI: 10.3969/j.issn.1671-637x.2020.10.021 Cite this Article
    XIE Wenguang, WANG Kenian, ZHANG Xiaochen, WU Kang. Design and Simulation of Anti-Single-Event-Upset in AFDX Switch Based on FPGA[J]. Electronics Optics & Control, 2020, 27(10): 105 Copy Citation Text show less

    Abstract

    In the flight environment of civil aviation. there are various high-energy particles. which may result in the effect of Single Event Upset (SEU) when acting on avionic equipment's SRAM-based FPGA. and cause device logic fault and system breakdown.Hence. the corresponding design of anti-single-event-upset must be taken into consideration for the SRAM-based FPGA in airborne equipment.According to the basic structure of AFDX switch. the concrete design measures are given for anti-single-event-upset of the FPGA based AFDX switch. and simulation-based verification is conducted by using the method of fault injection.It is shown that the method can effectively enhance the performance of resisting single event upset in FPGA based AFDX switch. thus can improve the reliability and stability of system in the application of aviation flight.
    XIE Wenguang, WANG Kenian, ZHANG Xiaochen, WU Kang. Design and Simulation of Anti-Single-Event-Upset in AFDX Switch Based on FPGA[J]. Electronics Optics & Control, 2020, 27(10): 105
    Download Citation