[1] He W, Zhang G, Zhang X X, Ji J, Li G Q, Zhao X D[J]. Appl. Energy, 143, 1(2015).
[5] Liu W S, Jie Q, Kim H S, Ren Z F[J]. Acta Mater., 87, 357(2015).
[6] Li F, Huang X Y, Jiang W, Chen L D[J]. J. Electron. Mater., 42, 1219(2013).
[10] Peng H, Kioussis N, Snyder G J[J]. Phys. Rev. B, 89, 195206(2014).
[13] Valery V K[J]. Reliability Issues in Electrical Contacts, 205-259(2006).
[14] Rowe D M[J]. Thermoelectrics Handbook, 13-20(2006).
[18] Li H Y, Jing H Y, Han Y D, Lu G Q, Xu L Y, Liu T[J]. Mater. Des., 89, 604(2016).
[19] Ferreres X R, Yamini S A, Nancarrow M, Zhang C[J]. Mater. Des., 107, 90(2016).
[20] Hu X K, Zhang S M, Zhao F, Liu Y, Liu W S[J]. J. Inorg. Mater., 34, 269(2019).