Optimization Design of Step-up Stress Accelerated Degradation Test for a Photoelectric Coupler with Lognormal Distributed Life

ZHANG Xuan-gong; MU Xi-hui; FENG jing

doi:10.3969/j.issn.1671-637x.2018.11.021

Journals >Electronics Optics & Control >Volume 25 >Issue 11 >Page 106 > Article

Electronics Optics & Control
Vol. 25, Issue 11, 106 (2018)

Optimization Design of Step-up Stress Accelerated Degradation Test for a Photoelectric Coupler with Lognormal Distributed Life

ZHANG Xuan-gong¹, MU Xi-hui¹, and FENG jing²

Author Affiliations

¹[in Chinese]

²[in Chinese]

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DOI: 10.3969/j.issn.1671-637x.2018.11.021 Cite this Article

ZHANG Xuan-gong, MU Xi-hui, FENG jing. Optimization Design of Step-up Stress Accelerated Degradation Test for a Photoelectric Coupler with Lognormal Distributed Life[J]. Electronics Optics & Control, 2018, 25(11): 106 Copy Citation Text

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References

[1] MILLER R, NELSON W B.Optimum simple step-stress accelerated life testing［J］.IEEE Transactions on Reliability, 1983, 32(1):59-65.

[2] NELSON W.Accelerated testing:statistical methods, test plans, and data analysis［M］.New York:John Wiley Press, 1990.

[4] TSENG S T, YU H F.A termination rule for degradation experiments ［J］.IEEE Transactions on Reliability, 1997, 46(1):130-133.

[5] WU S J, CHANG C T.Optimal design of degradation tests in presence of cost constraint［J］.Reliability Engineering & System Safety, 2002, 76(2):109-115.

[6] YU H F, TSENG S T.Designing a degradation experiment［J］.Naval Research Logistics, 1999, 46(6):689-706.

[7] YU H F, TSENG S T.Designing a degradation experiment with a reciprocal Weibull degradation rate［J］.Quality Technology & Quantitative Management, 2004, 1(1):47-63.

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