• Opto-Electronic Engineering
  • Vol. 36, Issue 10, 35 (2009)
MA De-bao*, LIN Jian-lin, and CHEN Dong
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2009.10.007 Cite this Article
    MA De-bao, LIN Jian-lin, CHEN Dong. Model of Drift-scan CCD’s Rotation Control[J]. Opto-Electronic Engineering, 2009, 36(10): 35 Copy Citation Text show less

    Abstract

    CCD drift-scan technique can improve the survey efficiency of ground-based optoelectronic telescope system and the data precision of space targets. But, it is not suitable to survey the fast moving targets at present. Combinning with a rotated device of exactitude control is one of ways to spread the application of CCD drift-scan technique. The square CCD plane array was taken as template, and the model of drift-scan CCD’s rotation control was founded based on the study of CCD drift-scan technique. Then, the model was used to do the simulation experiment of observation. Furthermore, the imaging effect of different model parameters including revolving angle and pulse control period on survey was analyzed. By validating the above analyses through experiments, the rotation-control model proposed is showed to be available, and the relative results can be used as references for real survey.
    MA De-bao, LIN Jian-lin, CHEN Dong. Model of Drift-scan CCD’s Rotation Control[J]. Opto-Electronic Engineering, 2009, 36(10): 35
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