• Chinese Journal of Lasers
  • Vol. 41, Issue 9, 906001 (2014)
Wang Wei1、2、*, Zhang Lei1, Feng Suya1, Chen Wei1, and Hu Lili1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/cjl201441.0906001 Cite this Article Set citation alerts
    Wang Wei, Zhang Lei, Feng Suya, Chen Wei, Hu Lili. Using Fluorescent Microscopy Method to Study Subsurface Defects in Nd-Doped Phosphate Laser Glasses[J]. Chinese Journal of Lasers, 2014, 41(9): 906001 Copy Citation Text show less

    Abstract

    For N31 and N41 Nd-doped phosphate glasses with strong multiband absorption and emission, Rhodamine 6G (R6G) is chosen as the fluorescence label to realize high resolution two dimensional observation of subsurface defects (SSD) in these glasses under wide field microscopy, as the excitation and emission bands of R6G are different from the emission and excitation bands of Nd-doped phosphate laser glass respectively. It is demonstrated that the detected defects are classified as SSD by comparing the R6G fluorescence microscopy images and related optical microscopy images. The transformation of SSD during polishing process is analyzed according to related R6G fluorescence microscopy detection results. The results show that the crescent cracks which are near the tail end of deep Median type cracks are comparatively hard to be removed in the Nd-doped phosphate glass. These crescent cracks may induce strong modification to the incident optical field, and relatively increase the probability of laser induced surface damage.
    Wang Wei, Zhang Lei, Feng Suya, Chen Wei, Hu Lili. Using Fluorescent Microscopy Method to Study Subsurface Defects in Nd-Doped Phosphate Laser Glasses[J]. Chinese Journal of Lasers, 2014, 41(9): 906001
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