Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Electronics Optics & Control >Volume 26 >Issue 9 >Page 107 > Article
    • Electronics Optics & Control
    • Vol. 26, Issue 9, 107 (2019)
    A Failure Prediction Method Based on Echelon Inference and Benefit Principle
    LI Guo1, MA Chunyang2, LI Wei3, QU Chongnian1, and LI Genquan1
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
    • show less
    DOI: 10.3969/j.issn.1671-637x.2019.09.022 Cite this Article
    LI Guo, MA Chunyang, LI Wei, QU Chongnian, LI Genquan. A Failure Prediction Method Based on Echelon Inference and Benefit Principle[J]. Electronics Optics & Control, 2019, 26(9): 107 Copy Citation Text show less
    References
    Abstract
    Get PDF
    Figures&Tables (0)
    Equations (0)
    References (0)
    Get Citation
    Copy Citation Text
    LI Guo, MA Chunyang, LI Wei, QU Chongnian, LI Genquan. A Failure Prediction Method Based on Echelon Inference and Benefit Principle[J]. Electronics Optics & Control, 2019, 26(9): 107
    Download Citation
    Tools
    Share
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology