[1] A. Pentland, R. W. Picard, and S. Sclaroff, Proc. SPIE 2185, 34 (1994).
[2] M. Flickner, H. Sawhney, W. Niblack, J. Ashley, Q. Huang, B. Dom, M. Gorkani, J. Hafner, D. Lee, D. Petkovic, D. Steele, and P. Yanker, IEEE Computer 28, 23 (1995).
[3] C. Shyu, C. E. Brodley, A. C. Kak, A. Kosaka, A. M. Aisen, and L. S. Broderick, Computer Vision and Image Understanding 75, 111 (1999).
[4] M. Porat and Y. Y. Zeevi, IEEE Trans. Biomedical Engineering 36, 115 (1989).
[5] M. Porat and Y. Y. Zeevi, IEEE Trans. Pattern Analysis and Machine Intelligence 10, 452 (1988).