[1] H. Echtler, K. Segl, and C. D. Isograde, Proc. SPIE 4886, 115 (2002).
[2] ASTM Standard E-1392, "Standard practice for angle resolved optical scatter measurements on specular or diffuse surface."
[3] L. Li, H. Fukushima, K. Suzuki, and N. Suzuki, Proc. SPIE 6680, 668006 (2007).
[4] A Brner, L. Wiest, R. Reulke, R. Richter, P. Keller, M. Schaepman, and D. Schlopfer, ISPRS. Photogrammetry and Remote Sensing 55, 299 (2001).
[5] J. P. Kerekes, J. E. Baum, IEEE Transactions on Geoscience and Remote Sensing 43, 571 (2005).
[6] R. L. Sundberg, R. Kennett, and J. Gruninger, IEEE International Geoscience and Remote Sensing Symposium 5, 3237 (2004).
[7] T. Xu, Applied Function Analysis (Science Press, Beijing, 2002).