The BixFeO3 films (0.80≤x≤ 1.20) were prepared by sol-gel technique on Si substrates. Effects of x variation on microstructures and optical properties of the BixFeO3 films are reported. It is shown that in the films with both insufficient and excess bismuth dosage, impurity phases such as Bi2Fe4O9 and iron oxide appeared. Raman spectra of the films were presented in the spectral range of 50~800cm-1. The refractive index (n) of the films decreases with increasing x at wavelength lower than 600nm, the extinction coefficients (k) of all films were comparable. The bandgaps of the films changed from 2.65eV to 2.76eV.