A method for measuring material deformation with linear CCD detectors

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 29 >Issue 4 >Page 20 > Article

Opto-Electronic Engineering
Vol. 29, Issue 4, 20 (2002)

A method for measuring material deformation with linear CCD detectors

[in Chinese]^1、2, [in Chinese]^1、2, [in Chinese]^1、2, and [in Chinese]^1、2

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¹[in Chinese]

²[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. A method for measuring material deformation with linear CCD detectors[J]. Opto-Electronic Engineering, 2002, 29(4): 20 Copy Citation Text

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Abstract

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. A method for measuring material deformation with linear CCD detectors[J]. Opto-Electronic Engineering, 2002, 29(4): 20

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