• Optoelectronics Letters
  • Vol. 9, Issue 2, 116 (2013)
Zhe LIU and Yi-kun BU*
Author Affiliations
  • Department of Electronic Engineering, Xiamen University, Xiamen 361005, China
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    DOI: 10.1007/s11801-013-2406-y Cite this Article
    LIU Zhe, BU Yi-kun. Low loss Nb2O5 films deposited by novel remote plasma sputtering[J]. Optoelectronics Letters, 2013, 9(2): 116 Copy Citation Text show less

    Abstract

    We report the deposition of Nb2O5 films on unheated BK-7 glass substrates using remote plasma sputtering system. The remote plasma geometry allows pseudo separation of plasma and target bias parameters, which offers complete deposition rate control. Using appropriate oxygen flow rates, high-density and low-loss Nb2O5 films are deposited with rates up to 0.49 nm/s. Lower deposition rates (~0.026 nm/s) can also be obtained by working at low target current and voltage and at low pressure. Nb2O5 films deposited at different rates have the refractive index of about 2.3 and the extinction coefficient as low as 6.9×10-5.
    LIU Zhe, BU Yi-kun. Low loss Nb2O5 films deposited by novel remote plasma sputtering[J]. Optoelectronics Letters, 2013, 9(2): 116
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