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    Journals >Chinese Journal of Lasers >Volume 16 >Issue 3 >Page 151 > Article
    • Chinese Journal of Lasers
    • Vol. 16, Issue 3, 151 (1989)
    High accuracy measurement of laser induced X-ray spectrum from GaAs Plasma
    Feng Xianpi, Xu Zhishan, Zhang Zhengquan, Chen Shisheng, and Zheng Danching
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    Feng Xianpi, Xu Zhishan, Zhang Zhengquan, Chen Shisheng, Zheng Danching. High accuracy measurement of laser induced X-ray spectrum from GaAs Plasma[J]. Chinese Journal of Lasers, 1989, 16(3): 151 Copy Citation Text show less

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    Feng Xianpi, Xu Zhishan, Zhang Zhengquan, Chen Shisheng, Zheng Danching. High accuracy measurement of laser induced X-ray spectrum from GaAs Plasma[J]. Chinese Journal of Lasers, 1989, 16(3): 151
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    Paper Information
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