• Opto-Electronic Engineering
  • Vol. 33, Issue 3, 17 (2006)
[in Chinese] and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. New testing approach for sighting error and non-perpendicularity between horizontal axis and vertical axis for a photoelectrical theodolite[J]. Opto-Electronic Engineering, 2006, 33(3): 17 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese]. New testing approach for sighting error and non-perpendicularity between horizontal axis and vertical axis for a photoelectrical theodolite[J]. Opto-Electronic Engineering, 2006, 33(3): 17
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