• Electronics Optics & Control
  • Vol. 24, Issue 5, 36 (2017)
HU Wen-chao1, ZHOU Wei2, and GUAN Jian3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2017.05.007 Cite this Article
    HU Wen-chao, ZHOU Wei, GUAN Jian. Remote Sensing Image Matching Based on Improved SIFT Algorithm[J]. Electronics Optics & Control, 2017, 24(5): 36 Copy Citation Text show less
    References

    [1] BROWN L G.A survey of image registration techniques[J].ACM Computer Surveys, 1992, 24(4):325-376.

    [5] LOWE D G.Object recognition from local scale-invariant features[C]//Proceedings of the Seventh IEEE International Conference on Computer Vision, 1999:1150-1157.

    [6] LOWE D G.Distinctive image features from scale-invariant keypoints[J].International Journal of Computer Vision, 2004, 60(2):91-110.

    [7] ZHAO J, LIU H Z, FENG Y L, et al.BE-SIFT:a more brief and efficient SIFT image matching algorithm for computer vision[C]//IEEE International Conference on Computer and Information Technology;Ubiquitous Computing and Communications;Dependable, Autonomic and Secure Compiting;Pervasive Intelligence and Computing(CIT/IUCC/DASC/PICOM), 2015:568-574.

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    HU Wen-chao, ZHOU Wei, GUAN Jian. Remote Sensing Image Matching Based on Improved SIFT Algorithm[J]. Electronics Optics & Control, 2017, 24(5): 36
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