• Acta Photonica Sinica
  • Vol. 39, Issue s1, 19 (2010)
DONG Hui*, ZHOU Yan, GUO Jun, ZHANG Wan-yi, and WANG Wen-sheng
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/gzxb201039s1.0019 Cite this Article
    DONG Hui, ZHOU Yan, GUO Jun, ZHANG Wan-yi, WANG Wen-sheng. Digital Speckle Pattern Interferometry for Deformation Measurement[J]. Acta Photonica Sinica, 2010, 39(s1): 19 Copy Citation Text show less

    Abstract

    The technique of measuring displacement and deformation based on principle of digital speckle pattern interferometry was studied.Traditional recording plane in speckle pattern interferometry was substituted by charge coupled device camera.The method left out the wet chemical process of developing and fixing.The speckle patterns were obtained in two ways of Fresnel speckle method and image plane speckle method.Two patterns of speckle interference field before and after deformation were recorded by charge coupled device camera and stored in computer; after subtracting and taking the absolute value,the correlative fringe pattern including object′s deformation information was acquired.Processing the pattern with low-pass Gauss filter,the contrast of interference pattern was enhanced.The scanning central row method was proposed.From the one dimension phase distribution of central row,one dimension deformation was obtained and interference fringes interpreter was automatically realized.The experiment shows that this method is simple and available.
    DONG Hui, ZHOU Yan, GUO Jun, ZHANG Wan-yi, WANG Wen-sheng. Digital Speckle Pattern Interferometry for Deformation Measurement[J]. Acta Photonica Sinica, 2010, 39(s1): 19
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