• Optoelectronics Letters
  • Vol. 14, Issue 3, 206 (2018)
Bao-lu TIAN, Huai-xi CHEN, K Choge Dismas, Yi-bin XU, Guang-wei LI, and Wan-guo and LIANG*
Author Affiliations
  • Fujian Institute of Research on the Structure of Matter,Chinese Academy of Sciences, Fuzhou 350002, China
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    DOI: 10.1007/s11801-017-7049-y Cite this Article
    TIAN Bao-lu, CHEN Huai-xi, Choge Dismas K, XU Yi-bin, LI Guang-wei, and LIANG Wan-guo. Nondestructive characterization of the domain structure of periodically poled lithium niobate crystal based on rigorous coupled-wave analysis[J]. Optoelectronics Letters, 2018, 14(3): 206 Copy Citation Text show less

    Abstract

    We report rigorous coupled-wave analysis (RCWA) method to non-destructively characterize the domain structure of periodically poled lithium niobate (PPLN) crystal. The strong light diffraction effect is achieved by applying a proper external voltage. We can observe reversed domain pattern and employ the detected diffraction intensity to optimally fit the result of RCWA based on least square method. Compared with conventional scalar diffraction theory, more accurate domain structure parameters with accuracies of 0.05 ?倕 m and 0.005 for the period and duty cycle are obtained respectively. It is proved that accurate, real-time and nondestructive characterization can be realized via this method.
    TIAN Bao-lu, CHEN Huai-xi, Choge Dismas K, XU Yi-bin, LI Guang-wei, and LIANG Wan-guo. Nondestructive characterization of the domain structure of periodically poled lithium niobate crystal based on rigorous coupled-wave analysis[J]. Optoelectronics Letters, 2018, 14(3): 206
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