Analysis, fabrication, and measurement of Y aperture element frequency selective surface

Xiaoqiu Li; Jianmin Zhou; Jinsong Gao

Journals >Chinese Optics Letters >Volume 5 >Issue 11 >Page 660 > Article

Chinese Optics Letters
Vol. 5, Issue 11, 660 (2007)

Analysis, fabrication, and measurement of Y aperture element frequency selective surface

Xiaoqiu Li^1、2、*, Jianmin Zhou^1、2, and Jinsong Gao³

Author Affiliations

¹Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033

²Graduate School of the Chinese Academy of Sciences, Beijing 100039

³East China Jiaotong University, Nanchang 330013

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Xiaoqiu Li, Jianmin Zhou, Jinsong Gao. Analysis, fabrication, and measurement of Y aperture element frequency selective surface[J]. Chinese Optics Letters, 2007, 5(11): 660 Copy Citation Text

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Abstract

The analysis of Y aperture element frequency selective surface (FSS) using the spectral domain method and the moment method is presented. With the vacuum depositing and photolithography, the corresponding Y aperture element FSS was produced, and it was tested in the microwave darkroom. The calculated and measured results are in good agreement.

Keywords

220.3740 240.0310 240.6700 070.6110

Xiaoqiu Li, Jianmin Zhou, Jinsong Gao. Analysis, fabrication, and measurement of Y aperture element frequency selective surface[J]. Chinese Optics Letters, 2007, 5(11): 660

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