• Optics and Precision Engineering
  • Vol. 31, Issue 16, 2319 (2023)
Zhiwei XIA, Shuo WANG, Xiaolong YI, Yupeng WANG*, and Wei FANG
Author Affiliations
  • Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun130033, China
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    DOI: 10.37188/OPE.20233116.2319 Cite this Article
    Zhiwei XIA, Shuo WANG, Xiaolong YI, Yupeng WANG, Wei FANG. Method for unattended measurement of surface reflectance in field sites[J]. Optics and Precision Engineering, 2023, 31(16): 2319 Copy Citation Text show less
    Composition of the automatic surface reflectance monitor
    Fig. 1. Composition of the automatic surface reflectance monitor
    Pictures of automatic surface reflectance monitor installation
    Fig. 2. Pictures of automatic surface reflectance monitor installation
    Composition of automatic diffuse-to-global irradiance ratios monitor
    Fig. 3. Composition of automatic diffuse-to-global irradiance ratios monitor
    Pictures of automatic diffuse-to-global irradiance ratios monitor installation
    Fig. 4. Pictures of automatic diffuse-to-global irradiance ratios monitor installation
    Diagram of the standard whiteboard reflectance
    Fig. 5. Diagram of the standard whiteboard reflectance
    Annual variation curve of noon solar elevation angle in Dunhuang
    Fig. 6. Annual variation curve of noon solar elevation angle in Dunhuang
    Lambert correction coefficients at different solar elevation angles
    Fig. 7. Lambert correction coefficients at different solar elevation angles
    Measured reflectance of the field by whiteboard method (Day 1, Ei=27.94°, Az=183.72°)
    Fig. 8. Measured reflectance of the field by whiteboard method (Day 1, Ei=27.94°, Az=183.72°)
    Reflectance coefficient of irradiance method
    Fig. 9. Reflectance coefficient of irradiance method
    Relative uncertainty of spectral measurement module
    Fig. 10. Relative uncertainty of spectral measurement module
    Measured reflectance of field by whiteboard method
    Fig. 11. Measured reflectance of field by whiteboard method
    Difference comparison of surface reflectance
    Fig. 12. Difference comparison of surface reflectance
    Measured reflectance of field by irradiance method
    Fig. 13. Measured reflectance of field by irradiance method
    Difference comparison of surface reflectance
    Fig. 14. Difference comparison of surface reflectance
    Measured reflectance of field by whiteboard method
    Fig. 15. Measured reflectance of field by whiteboard method
    Difference comparison of surface reflectance
    Fig. 16. Difference comparison of surface reflectance
    Measured reflectance of field by irradiance method
    Fig. 17. Measured reflectance of field by irradiance method
    Difference comparison of surface reflectance
    Fig. 18. Difference comparison of surface reflectance
    Difference comparison of surface reflectance
    Fig. 19. Difference comparison of surface reflectance
    Surface reflectance correction
    Fig. 20. Surface reflectance correction
    Spectral range350~2 500 nm
    Spectral resolution

    4 nm@350~1 000 nm

    10 nm@1 000~1 900 nm

    7 nm@1 900~2 500 nm

    Field of view
    Accuracy of reflectance measurement0.01 (Non-absorbing band)
    Operating environment temperature-20~60 ℃
    Table 1. Specifications of the automatic surface reflectance monitor
    Spectral range350~2 500 nm
    Spectral resolution

    4 nm@350~1 000 nm

    10 nm@1 000~1 900 nm

    7 nm@1 900~2 500 nm

    Field of view180°
    Accuracy of diffuse-to-global ratios measurement0.01 (Non-absorbing band)
    Operating environment temperature-20~60 ℃
    Table 2. Specifications of automatic diffuse-to-global irradiance ratios monitor
    Relative uncertainty of reflectance of whiteboard1.029%
    Lambert correction of whiteboard≤0.005
    Relative uncertainty of radiance measurement≤0.5%
    Relative uncertainty of irradiance measurement≤0.5%
    Composite relative uncertainty≤1.345%
    Table 3. Uncertainty of the coefficient of irradiance method
    Standard whiteboard methodIrradiance method
    Relative uncertainty of reflectance of whiteboard1.029%Relative uncertainty of reflectance calibration coefficient≤1.345%
    Lambert correction of whiteboard≤0.005Relative uncertainty of surface radiance measurement≤0.5%
    Relative uncertainty of whiteboard radiance measurement≤0.5%Relative uncertainty of irradiance measurement≤0.5%
    Relative uncertainty of surface radiance measurement≤0.5%Composite relative uncertainty≤1.520%
    Composite relative uncertainty≤1.345%Composite absolute uncertainty≤0.005 3
    Composite absolute uncertainty≤0.004 7
    Table 4. Uncertainty of reflectance measurement
    Zhiwei XIA, Shuo WANG, Xiaolong YI, Yupeng WANG, Wei FANG. Method for unattended measurement of surface reflectance in field sites[J]. Optics and Precision Engineering, 2023, 31(16): 2319
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