• Journal of Terahertz Science and Electronic Information Technology
  • Vol. 20, Issue 6, 626 (2022)
HOU Yanfei1、2、*, WANG Bowu1, YU Weihua1, CHENG Wei3, and SUN Yan3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • show less
    DOI: 10.11805/tkyda2020132 Cite this Article
    HOU Yanfei, WANG Bowu, YU Weihua, CHENG Wei, SUN Yan. Parasitic modes caused by defect ground structure in multilayer integrated circuit[J]. Journal of Terahertz Science and Electronic Information Technology , 2022, 20(6): 626 Copy Citation Text show less

    Abstract

    In multilayer integrated circuit, the parasitic mode problem is caused by Defect Ground Structure(DGS). By comparing the effects of window shielding form and various back hole arrays in suppressing the propagation of parasitic modes, it is found that the window shielding form can effectively suppress the propagation of parasitic modes but greatly increase the circuit loss. The existence of the simplest back hole array can achieve parasitic suppression. Without changing the process structure, the double-back-hole form and the four-back-hole form can meet the suppression requirements of dielectric films below 200 GHz and 300 GHz respectively. In these cases, the back holes occupy the smallest area. It can effectively reduce the back hole arrangement density and increase the circuit integration.
    HOU Yanfei, WANG Bowu, YU Weihua, CHENG Wei, SUN Yan. Parasitic modes caused by defect ground structure in multilayer integrated circuit[J]. Journal of Terahertz Science and Electronic Information Technology , 2022, 20(6): 626
    Download Citation