• Optics and Precision Engineering
  • Vol. 17, Issue 5, 964 (2009)
SHEN Yi1,*, WANG Yong-jing2, WANG Lin-jing3, JIANG Yan-sen4, and CHEN Shao-yuan1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
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    SHEN Yi, WANG Yong-jing, WANG Lin-jing, JIANG Yan-sen, CHEN Shao-yuan. Measuring and analyzing system for retardation films at different wavelengths[J]. Optics and Precision Engineering, 2009, 17(5): 964 Copy Citation Text show less
    References

    [1] YAN M,GAO ZH SH. The simple method research for measuring the phase retardation of wave-plates [J]. Laser Technology,2005,29(3):233-236. (in Chinese)

    [2] ZHANG J B,LI G H. Studies on hardness of surface layer treated by laser [J]. Journal of Optoelectronic· Lasers,1997,8(3):202-204. (in Chinese)

    [3] XU W D,LI X SH. A new method for measuring phase delay of wave plate [J]. Acta Optica Sinica,1994,14(10):1096-1101. (in Chinese)

    [4] FAN L,SONG F J. Spectrum analysis of modulated polarized light in phase retardation measurement [J]. Spectroscopy and Spectral Analysis,2007,27(9):1685-1688. (in Chinese)

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    [9] ZHU Q CH,CHEN SH SH. Matrix Optics Introduction [M]. Shanghai: Shanghai Science and Technology Literature Publishing House,1991.(in Chinese)

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    [11] JERRARD H G. Optical compensators for measurement of elliptical polarization [J]. J. Opt. Soc. Am.,1948,38(l):35-59.

    [12] GE B. A study on the measurement method for elliptical polarization parameters of 90° thin film phase retarder at 10.6μm[J]. Optics and Precision Engineering,1991(2):56-59. (in Chinese)

    [13] ZHANG D W,LI G H,SONG L K,et al.. Study on the polarization interference spectrum of mica quarter-wave plates[J]. Spectroscopy and Spectral Analysis,2002,22(2):195-197. (in Chinese)

    [14] YOLKEN H T,WAXLER R M,KRUGER J. Ellipsometric errors due to multiple reflection in mica quarter-wave plates[J]. J. Opt. Soc. Am.,1967,57(2): 283-284

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    SHEN Yi, WANG Yong-jing, WANG Lin-jing, JIANG Yan-sen, CHEN Shao-yuan. Measuring and analyzing system for retardation films at different wavelengths[J]. Optics and Precision Engineering, 2009, 17(5): 964
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