• Chinese Optics Letters
  • Vol. 12, Issue 12, 123401 (2014)
Zhi Chen1、2, Honglan Xie1, Biao Deng1, Guohao Du1, Huaidong Jiang3, and Tiqiao Xiao1、2
Author Affiliations
  • 1Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, China
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    DOI: 10.3788/col201412.123401 Cite this Article Set citation alerts
    Zhi Chen, Honglan Xie, Biao Deng, Guohao Du, Huaidong Jiang, Tiqiao Xiao. Toward one nanometer X-ray focusing: a complex refractive lens design[J]. Chinese Optics Letters, 2014, 12(12): 123401 Copy Citation Text show less

    Abstract

    We report a design for one nanometer X-ray focusing by a complex refractive lens, which is capable of focusing 20 keV X-rays down to a lateral size of 0.92 nm (full-width at half-maximum (FWHM)) and an axial size of 98 nm (FWHM) with intensity gain of 49050. This complex refractive lens is comprised of a series of kinoform lenses, whose aperture is gradually matched to the converging trace of the X-ray beam so as to increase the numerical aperture (NA). The theoretical principle of the proposed complex refractive lens is presented. The NAs of these lenses are calculated. The numerical simulation results demonstrate that the proposed design can focus the X-ray beam into sub-nanometer while remaining high gain.
    Zhi Chen, Honglan Xie, Biao Deng, Guohao Du, Huaidong Jiang, Tiqiao Xiao. Toward one nanometer X-ray focusing: a complex refractive lens design[J]. Chinese Optics Letters, 2014, 12(12): 123401
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