• High Power Laser Science and Engineering
  • Vol. 12, Issue 4, 04000e47 (2024)
Bin Ma1,2,3,4,*, Shuang Guan1,2, Dongyue Yan1,2, Qiaofei Pan1,2..., Zhiqiang Hou1,2, Ke Wang1,2 and Jiaqi Han1,2|Show fewer author(s)
Author Affiliations
  • 1Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai, China
  • 2MOE Key Laboratory of Advanced Micro-Structured Materials, Tongji University, Shanghai, China
  • 3Shanghai Frontiers Science Center of Digital Optics, Tongji University, Shanghai, China
  • 4Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications, Tongji University, Shanghai, China
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    DOI: 10.1017/hpl.2024.28 Cite this Article Set citation alerts
    Bin Ma, Shuang Guan, Dongyue Yan, Qiaofei Pan, Zhiqiang Hou, Ke Wang, Jiaqi Han, "The influence of space environmental factors on the laser-induced damage thresholds in optical components," High Power Laser Sci. Eng. 12, 04000e47 (2024) Copy Citation Text show less
    Simulated impacts from different types of microscopic fragments: (a) penetration holes, (b) compression-induced cracking and (c) cratering.
    Fig. 1. Simulated impacts from different types of microscopic fragments: (a) penetration holes, (b) compression-induced cracking and (c) cratering.
    Damage condition of high-reflectance thin film (one series) and substrate (two series) samples: (a) initial damage morphology; (b) damage to the membrane around the hole; (c) bright spots appearing around the hole; (d) extensive damage centered around the hole.
    Fig. 2. Damage condition of high-reflectance thin film (one series) and substrate (two series) samples: (a) initial damage morphology; (b) damage to the membrane around the hole; (c) bright spots appearing around the hole; (d) extensive damage centered around the hole.
    LIDT results for different states in 30 μm substrates and high-reflection films (1, initial damage morphology; 2, damage to the membrane around the hole; 3, bright spots appearing around the hole; 4, extensive damage centered around the hole).
    Fig. 3. LIDT results for different states in 30 μm substrates and high-reflection films (1, initial damage morphology; 2, damage to the membrane around the hole; 3, bright spots appearing around the hole; 4, extensive damage centered around the hole).
    A comparison of LIDTs for high-reflection films under the action of single space environmental factors (‘Without’ represents being without any space environmental factors).
    Fig. 4. A comparison of LIDTs for high-reflection films under the action of single space environmental factors (‘Without’ represents being without any space environmental factors).
    A comparison of LIDTs for substrates under the action of single space environmental factors (‘Without’ represents being without any space environmental factors).
    Fig. 5. A comparison of LIDTs for substrates under the action of single space environmental factors (‘Without’ represents being without any space environmental factors).
    A comparison of LIDT values produced by the coupled effect of atomic oxygen and protons.
    Fig. 6. A comparison of LIDT values produced by the coupled effect of atomic oxygen and protons.
    A comparison of LIDT values for simulated fragment compressions in (a) high-reflectance films and (b) substrates. A, protons and atomic oxygen; B, protons and penetration; C, atomic oxygen and penetration; D, protons and atomic oxygen and penetration.
    Fig. 7. A comparison of LIDT values for simulated fragment compressions in (a) high-reflectance films and (b) substrates. A, protons and atomic oxygen; B, protons and penetration; C, atomic oxygen and penetration; D, protons and atomic oxygen and penetration.
    Surface morphology images of three-band high-reflectance thin films before and after proton and atomic oxygen irradiation: (a) before proton irradiation; (b) after proton irradiation; (c) before atomic oxygen irradiation; (d) after atomic oxygen irradiation.
    Fig. 8. Surface morphology images of three-band high-reflectance thin films before and after proton and atomic oxygen irradiation: (a) before proton irradiation; (b) after proton irradiation; (c) before atomic oxygen irradiation; (d) after atomic oxygen irradiation.
    SRIM simulations of proton concentrations and atomic oxygen distributions within the membrane layer: (a) protons; (b) atomic oxygen.
    Fig. 9. SRIM simulations of proton concentrations and atomic oxygen distributions within the membrane layer: (a) protons; (b) atomic oxygen.
    LIDT reduction
    SampleAtomicProtons &
    typeProtonsoxygenatomic oxygen
    High–reflectance films15.38%13.12%26.93%
    Substrates19.48%18.19%41.09%
    Table 1. A comparison of LIDT reductions for different modes of action.
    LIDT reduction
    Proton &Proton &Proton &
    Sampleatomic oxygenatomic oxygenatomic oxygen
    type& penetration& compression& craters
    High–reflectance63.19%77.35%66.73%
    films
    Substrates79.29%87.73%79.29%
    Table 2. A comparison of LIDT reductions for different combinations of three space environmental factors.
    WavelengthRelative valuesRelative valuesAmplification
    (nm)before irradiationafter irradiation
    10647.48.920.3%
    5325.26.321.2%
    3552.33.447.8%
    Table 3. Test results for weak absorption corresponding to three operating wavelengths[39].
    Bin Ma, Shuang Guan, Dongyue Yan, Qiaofei Pan, Zhiqiang Hou, Ke Wang, Jiaqi Han, "The influence of space environmental factors on the laser-induced damage thresholds in optical components," High Power Laser Sci. Eng. 12, 04000e47 (2024)
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