• Electronics Optics & Control
  • Vol. 20, Issue 6, 100 (2013)
PAN Gang, LIANG Yuying, Lv Meng, and ZHANG Guolong
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2013.06.023 Cite this Article
    PAN Gang, LIANG Yuying, Lv Meng, ZHANG Guolong. Optimization Design of Double-Step-Down-Stress Accelerated Degradation Test Based on Monte-Carlo Simulation[J]. Electronics Optics & Control, 2013, 20(6): 100 Copy Citation Text show less
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    [8] LIAO C MTSENG S T.Optimal design for step-stress accelerated degradation tests[J].IEEE Transactions on Reliability200655(1):59-66.

    [9] LI XiaoyangJIANG Tongmin.Optimal design for step-stress accelerated degradation with competing failure modes[C]//Annual Reliability and Maintainability Symposium2009:64-68.

    PAN Gang, LIANG Yuying, Lv Meng, ZHANG Guolong. Optimization Design of Double-Step-Down-Stress Accelerated Degradation Test Based on Monte-Carlo Simulation[J]. Electronics Optics & Control, 2013, 20(6): 100
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